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a. Equipment using coherent “signal processing” between two or more beacons and the hydrophone unit carried by the surface vessel or underwater vehicle;
b. Equipment capable of automatically correcting speed-of-sound propagation errors for calculation of a point.
a.2. Passive (receiving, whether or not related in normal application to separate active equipment) systems, equipment and specially designed components therefor, as follows:
a.2.a. Hydrophones having any of the following characteristics:
Note: The control status of hydrophones specially designed for other equipment is determined by the control status of the other equipment.
a.2.a.1. Incorporating continuous flexible sensing elements;
a.2.a.2. Incorporating flexible assemblies of discrete sensing elements with either a diameter or length less than 20 mm and with a separation between elements of less than 20 mm;
a.2.a.3. Having any of the following sensing elements:
a.2.a.3.a. Optical fibers; or
a.2.a.3.b. Piezoelectric polymer films other than polyvinylidene-fluoride (PVDF) and its co-polymers {P(VDF–TrFE) and P(VDF–TFE)}; or
a.2.a.3.c. Flexible piezoelectric composites;
a.2.a.4. A hydrophone sensitivity better than -180dB at any depth with no acceleration compensation;
a.2.a.5. When designed to operate at depths exceeding 35 m with acceleration compensation; or
a.2.a.6. Designed for operation at depths exceeding 1,000 m;
Technical Notes: 1. “Piezoelectric polymer film” sensing elements consist of polarized polymer film that is stretched over and attached to a supporting frame or spool (mandrel).
2. ‘Flexible piezoelectric composite’ sensing elements consist of piezoelectric ceramic particles or fibers combined with an electrically insulating, acoustically transparent rubber, polymer or epoxy compound, where the compound is an integral part of the sensing elements.
3. Hydrophone sensitivity is defined as twenty times the logarithm to the base 10 of the ratio of rms output voltage to a 1 V rms reference, when the hydrophone sensor, without a pre-amplifier, is placed in a plane wave acoustic field with an rms pressure of 1 µPa. For example, a hydrophone of -160 dB (reference 1 V per µPa) would yield an output voltage of 10-8 V in such a field, while one of -180 dB sensitivity would yield only 10-9 V output. Thus, -160 dB is better than -180 dB.
a.2.b. Towed acoustic hydrophone arrays having any of the following:
a.2.b.1. Hydrophone group spacing of less than 12.5 m or “able to be modified” to have hydrophone group spacing of less than 12.5 m;
a.2.b.2. Designed or ‘able to be modified’ to operate at depths exceeding 35m;
Technical Note: “Able to be modified” in 6A001.a.2.b means having provisions to allow a change of the wiring or interconnections to alter hydrophone group spacing or operating depth limits. These provisions are: spare wiring exceeding 10% of the number of wires, hydrophone group spacing adjustment blocks or internal depth limiting devices that are adjustable or that control more than one hydrophone group.
a.2.b.3. Heading sensors controlled by 6A001.a.2.d;
a.2.b.4. Longitudinally reinforced array hoses;
a.2.b.5. An assembled array of less than 40 mm in diameter;
a.2.b.6. Multiplexed hydrophone group signals designed to operate at depths exceeding 35 m or having an adjustable or removable depth sensing device in order to operate at depths exceeding 35 m; or
a.2.b.7. Hydrophone characteristics controlled by 6A001.a.2.a;
a.2.c. Processing equipment, specially designed for towed acoustic hydrophone arrays, having “user accessible programmability” and time or frequency domain processing and correlation, including spectral analysis, digital filtering and beamforming using Fast Fourier or other transforms or processes;
a.2.d. Heading sensors having all of the following:
a.2.d.1. An accuracy of better than ±0.5°; and
a.2.d.2. Designed to operate at depths exceeding 35 m or having an adjustable or removable depth sensing device in order to operate at depths exceeding 35 m;
a.2.e. Bottom or bay cable systems having any of the following:
a.2.e.1. Incorporating hydrophones controlled by 6A001.a.2.a; or
a.2.e.2. Incorporating multiplexed hydrophone group signal modules having all of the following characteristics:
a.2.e.2.a. Designed to operate at depths exceeding 35 m or having an adjustable or removal depth sensing device in order to operate at depths exceeding 35 m; and
a.2.e.2.b. Capable of being operationally interchanged with towed acoustic hydrophone array modules;
a.2.f. Processing equipment, specially designed for bottom or bay cable systems, having “user accessible programmability” and time or frequency domain processing and correlation, including spectral analysis, digital filtering and beamforming using Fast Fourier or other transforms or processes;
b. Correlation-velocity sonar log equipment designed to measure the horizontal speed of the equipment carrier relative to the sea bed at distances between the carrier and the sea bed exceeding 500 m.
6A002 Optical sensors.
License Requirements
Reason for Control: NS, MT, CC, RS, AT, UN.
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Control(s) Country chart
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NS applies to entire entry............ NS Column 2.
MT applies to optical detectors in MT Column 1.
6A002.a.1, a.3, or .e that are
specially designed or modified to
protect ``missiles'' against nuclear
effects (e.g., Electromagnetic Pulse
(EMP), X-rays, combined blast and
thermal effects), and usable for
``missiles''.
RS applies to 6A002.a.1, a.2, a.3, .c, RS Column 1.
and .e.
CC applies to police-model infrared CC Column 1.
viewers in 6A002.c.
AT applies to entire entry............ AT Column 1.
UN applies to 6A002.a.1, a.2 a.3 and c Iraq and Rwanda.
------------------------------------------------------------------------
License Requirement Notes: See §743.1 of the EAR for reporting requirements for exports under License Exceptions.
License Exceptions
LVS: $3000, except N/A for MT and for 6A002.a.1, a.2, a.3, .c, and .e
GBS: N/A
CIV: N/A
List of Items Controlled
Unit: Equipment in number; parts and accessories in $ value.
Related Controls: The following commodities are subject to the export licensing authority of U.S. Department of State, Directorate of Defense Trade Controls (22 CFR part 121): 1.) “Image intensifiers” defined in 6A002.a.2 and “focal plane arrays” defined in 6A002.a.3 specially designed, modified, or configured for military use and not part of civil equipment; 2.) “Space qualified” solid-state detectors defined in 6A002.a.1, “space qualified” imaging sensors (e.g., “monospectral imaging sensors” and “multispectral imaging sensors”) defined in 6A002.b.2.b.1, and “space qualified” cryocoolers defined in 6A002.d.1, unless, on or after September 23, 2002, the Department of State issues a commodity jurisdiction determination assigning the export licensing authority to the Department of Commerce, Bureau of Industry and Security. See also 6A102, 6A202, and 6A992
Note: Exporters may apply for a commodity jurisdiction request with the Department of State, Directorate of Defense Trade Controls for “space qualified” solid-state detectors defined in 6A002.a.1 and imaging sensors (e.g., “monospectral imaging sensors” and “multispectral imaging sensors”) defined in 6A002.b.2.b.1 that may have predominant civil application(s).
Related Definitions: N/A
Items:
a. Optical detectors, as follows:
Note: 6A002.a does not control germanium or silicon photodevices.
N.B. Silicon and other material based “microbolometer” non “space-qualified” “focal plane arrays” are only specified under 6A002.a.3.f.
a.1. “Space-qualified” solid-state detectors, as follows:
a.1.a. “Space-qualified” solid-state detectors, having all of the following:
a.1.a.1. A peak response in the wavelength range exceeding 10 nm but not exceeding 300 nm; and
a.1.a.2. A response of less than 0.1% relative to the peak response at a wavelength exceeding 400 nm;
a.1.b. “Space-qualified” solid-state detectors, having all of the following:
a.1.b.1. A peak response in the wavelength range exceeding 900 nm but not exceeding 1,200 nm; and
a.1.b.2. A response “time constant” of 95 ns or less;
a.1.c. “Space-qualified” solid-state detectors having a peak response in the wavelength range exceeding 1,200 nm but not exceeding 30,000 nm;
a.2. Image intensifier tubes and specially designed components therefor, as follows:
a.2.a. Image intensifier tubes having all of the following:
a.2.a.1. A peak response in the wavelength range exceeding 400 nm but not exceeding 1,050 nm;
a.2.a.2. A microchannel plate for electron image amplification with a hole pitch (center-to-center spacing) of 12 µm or less; and
a.2.a.3. Any of the following photocathodes:
a.2.a.3.a. S-20, S-25 or multialkali photocathodes with a luminous sensitivity exceeding 350 µA/lm;
a.2.a.3.b. GaAs or GaInAs photocathodes; or
a.2.a.3.c. Other III–V compound semiconductor photocathodes;
Note: 6A002.a.2.a.3.c does not apply to compound semiconductor photocathodes with a maximum radiant sensitivity of 10 mA/W or less.
a.2.b. Specially designed components, as follows:
a.2.b.1. Microchannel plates having a hole pitch (center-to-center spacing) of 12 µm or less;
a.2.b.2. GaAs or GaInAs photocathodes;
a.2.b.3. Other III–V compound semiconductor photocathodes;
Note: 6A002.a.2.b.3 does not control compound semiconductor photocathodes with a maximum radiant sensitivity of 10 mA/W or less.
a.3. Non-“space-qualified” “focal plane arrays”, as follows:
N.B. Silicon and other material based ‘microbolometer’ non “space-qualified” “focal plane arrays” are only specified in 6A002.a.3.f.
Technical Notes:
1. Linear or two-dimensional multi-element detector arrays are referred to as “focal plane arrays”.
2. For the purposes of 6A002.a.3. ‘cross scan direction’ is defined as the axis parallel to the linear array of detector elements and the ‘scan direction’ is defined as the axis perpendicular to the linear array of detector elements.
Note 1: 6A002.a.3 includes photoconductive arrays and photovoltaic arrays.
Note 2: 6A002.a.3 does not control:
a. Multi-element (not to exceed 16 elements) encapsulated photoconductive cells using either lead sulphide or lead selenide;
b. Pyroelectric detectors using any of the following:
b.1. Triglycine sulphate and variants;
b.2. Lead-lanthanum-zirconium titanate and variants;
b.3. Lithium tantalate;
b.4. Polyvinylidene fluoride and variants; or
b.5. Strontium barium niobate and variants.
a.3.a. Non-“space-qualified” “focal plane arrays”, having all of the following:
a.3.a.1. Individual elements with a peak response within the wavelength range exceeding 900 nm but not exceeding 1,050 nm; and
a.3.a.2. A response “time constant” of less than 0.5 ns;
a.3.b. Non-“space-qualified” “focal plane arrays”, having all of the following:
a.3.b.1. Individual elements with a peak response in the wavelength range exceeding 1,050 nm but not exceeding 1,200 nm; and
a.3.b.2. A response “time constant” of 95 ns or less;
a.3.c. Non-“space-qualified” non-linear (2-dimensional) “focal plane arrays”, having individual elements with a peak response in the wavelength range exceeding 1,200 nm but not exceeding 30,000 nm;
N.B. Silicon and other material based ‘microbolometer’ non-“space-qualified” “focal plane arrays” are only specified in 6A002.a.3.f.
a.3.d. Non-“space-qualified” linear (1-dimensional) “focal plane arrays”, having all of the following :
a.3.d.1. Individual elements with a peak response in the wavelength range exceeding 1,200 nm but not exceeding 2,500 nm; and
a.3.d.2. Any of the following:
a.3.d.2.a. A ratio of scan direction dimension of the detector element to the cross-scan direction dimension of the detector element of less than 3.8; or
a.3.d.2.b. Signal processing in the element (SPRITE);
a.3.e. Non-“space-qualified” linear (1-dimensional) “focal plane arrays”, having individual elements with a peak response in the wavelength range exceeding 2,500 nm but not exceeding 30,000 nm.
a.3.f. Non-“space-qualified” non-linear (2-dimensional) infrared “focal plane arrays” based on ‘microbolometer’ material having individual elements with an unfiltered response in the wavelength range equal to or exceeding 8,000 nm but not exceeding 14,000 nm.
Technical Notes:
1. For the purposes of 6A002.a.3.f. ‘microbolometer’ is defined as a thermal imaging detector that, as a result of a temperature change in the detector caused by the absorption of infrared radiation, is used to generate any usable signal.
2. Non-imaging thermal detectors are not controlled by 6A002.a.3. Imaging thermal detectors are a multi-element array of thermal detectors with the capacity to form a visual, electronic or other representation of an object with sufficient fidelity to enable understanding of its shape or other spatial characteristics, such as height, width, or area. A multi-element array of thermal detectors without the capacity to form spatial representation of an object is non-imaging.
3. 6A002.a.3.f captures all non-“space-qualified” non-linear (2-dimensional) infrared “focal plane arrays” based on microbolometer material having individual elements with any unfiltered response between 8,000 nm and 14,000 nm.
b. “Monospectral imaging sensors” and “multispectral imaging sensors” designed for remote sensing applications, having any of the following:
b.1. An Instantaneous-Field-Of-View (IFOV) of less than 200 µrad (microradians); or
b.2. Being specified for operation in the wavelength range exceeding 400 nm but not exceeding 30,000 nm and having all the following;
b.2.a. Providing output imaging data in digital format; and
b.2.b. Being any of the following:
b.2.b.1. “Space-qualified'; or
b.2.b.2. Designed for airborne operation, using other than silicon detectors, and having an IFOV of less than 2.5 mrad (milliradians).
c. Direct view imaging equipment operating in the visible or infrared spectrum, incorporating any of the following:
c.1. Image intensifier tubes having the characteristics listed in 6A002.a.2.a; or
c.2. “Focal plane arrays” having the characteristics listed in 6A002.a.3.
Technical Note: “Direct view” refers to imaging equipment, operating in the visible or infrared spectrum, that presents a visual image to a human observer without converting the image into an electronic signal for television display, and that cannot record or store the image photographically, electronically or by any other means.
Note: 6A002.c does not control the following equipment incorporating other than GaAs or GaInAs photocathodes:
a. Industrial or civilian intrusion alarm, traffic or industrial movement control or counting systems;
b. Medical equipment;
c. Industrial equipment used for inspection, sorting or analysis of the properties of materials;
d. Flame detectors for industrial furnaces;
e. Equipment specially designed for laboratory use.
d. Special support components for optical sensors, as follows:
d.1. “Space-qualified” cryocoolers;
d.2. Non-“space-qualified” cryocoolers, having a cooling source temperature below 218 K (-55 °C), as follows:
d.2.a. Closed cycle type with a specified Mean-Time-To-Failure (MTTF), or Mean-Time-Between-Failures (MTBF), exceeding 2,500 hours;
d.2.b. Joule-Thomson (JT) self-regulating minicoolers having bore (outside) diameters of less than 8 mm;
d.3. Optical sensing fibers specially fabricated either compositionally or structurally, or modified by coating, to be acoustically, thermally, inertially, electromagnetically or nuclear radiation sensitive.
e. “Space qualified” “focal plane arrays” having more than 2,048 elements per array and having a peak response in the wavelength range exceeding 300 nm but not exceeding 900 nm.
6A003 Cameras.
License Requirements
Reason for Control: NS, NP, RS, AT, UN.
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Control(s) Country chart
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NS applies to entire entry.............. NS Column 2.
NP applies to items controlled in NP Column 1.
paragraphs 6A003.a.2, a.3 and a.4.
RS applies to items controlled in RS Column 1.
6A003.b.3 and b.4.
AT applies to entire entry.............. AT Column 1.
UN applies to items controlled in Iraq and Rwanda.
6A003.b.3 and b.4.
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License Exceptions
LVS: $1500, except N/A for 6A003.a.2 through a.6, b.1, b.3 and b.4.
GBS: Yes for 6A003.a.1.
CIV: Yes for 6A003.a.1.
List of Items Controlled
Unit: Number.
Related Controls: (1) See ECCNs 6E001 (“development”), 6E002 (“production”), and 6E201 (“use”) for technology for items controlled under this entry. (2) Also see ECCN 6A203. (3) See ECCN 8A002.d and .e for cameras specially designed or modified for underwater use.
Related Definitions: N/A.
Items:
a. Instrumentation cameras and specially designed components therefor, as follows:
Note: Instrumentation cameras, controlled by 6A003.a.3 to 6A003.a.5, with modular structures should be evaluated by their maximum capability, using plug-ins available according to the camera manufacturer's specifications.
a.1. High-speed cinema recording cameras using any film format from 8 mm to 16 mm inclusive, in which the film is continuously advanced throughout the recording period, and that are capable of recording at framing rates exceeding 13,150 frames/s;
Note: 6A003.a.1 does not control cinema recording cameras designed for civil purposes.
a.2. Mechanical high speed cameras, in which the film does not move, capable of recording at rates exceeding 1,000,000 frames/s for the full framing height of 35 mm film, or at proportionately higher rates for lesser frame heights, or at proportionately lower rates for greater frame heights;
a.3. Mechanical or electronic streak cameras having writing speeds exceeding 10 mm/µs;
a.4. Electronic framing cameras having a speed exceeding 1,000,000 frames/s;
a.5. Electronic cameras, having all of the following:
a.5.a. An electronic shutter speed (gating capability) of less than 1 µs per full frame; and
a.5.b. A read out time allowing a framing rate of more than 125 full frames per second.
a.6. Plug-ins, having all of the following characteristics:
a.6.a. Specially designed for instrumentation cameras which have modular structures and that are controlled by 6A003.a; and
a.6.b. Enabling these cameras to meet the characteristics specified in 6A003.a.3, 6A003.a.4 or 6A003.a.5, according to the manufacturer's specifications.
b. Imaging cameras, as follows:
Note: 6A003.b does not control television or video cameras specially designed for television broadcasting.
b.1. Video cameras incorporating solid state sensors, having a peak response in the wavelength range exceeding 10nm, but not exceeding 30,000 nm and having all of the following:
b.1.a. Having any of the following:
b.1.a.1. More than 4 × 10 6 “active pixels” per solid state array for monochrome (black and white) cameras;
b.1.a.2. More than 4 × 10 6 “active pixels” per solid state array for color cameras incorporating three solid state arrays; or
b.1.a.3. More than 12 × 10 6 “active pixels” for solid state array color cameras incorporating one solid state array; and
b.1.b. Having any of the following:
b.1.b.1. Optical mirrors controlled by 6A004.a.;
b.1.b.2. Optical control equipment controlled by 6A004.d.; or
b.1.b.3. The capability for annotating internally generated camera tracking data.
Technical Notes:
1. For the purposes of this entry, digital video cameras should be evaluated by the maximum number of “active pixels” used for capturing moving images.
2. For the purpose of this entry, camera tracking data is the information necessary to define camera line of sight orientation with respect to the earth. This includes: (1) the horizontal angle the camera line of sight makes with respect to the earth's magnetic field direction and; (2) the vertical angle between the camera line of sight and the earth's horizon.
b.2. Scanning cameras and scanning camera systems, having all of the following:
b.2.a. A peak response in the wavelength range exceeding 10 nm, but not exceeding 30,000 nm;
b.2.b. Linear detector arrays with more than 8,192 elements per array; and
b.2.c. Mechanical scanning in one direction;
b.3. Imaging cameras incorporating image intensifier tubes having the characteristics listed in 6A002.a.2.a;
b.4. Imaging cameras incorporating “focal plane arrays” having any of the following:
b.4.a. Incorporating “focal plane arrays” controlled by 6A002.a.3.a. to 6A002.a.3.e.; or
b.4.b. Incorporating “focal plane arrays” controlled by 6A002.a.3.f.
Note 1: “Imaging cameras” described in 6A003.b.4 include “focal plane arrays” combined with sufficient signal processing electronics, beyond the read out integrated circuit, to enable as a minimum the output of an analog or digital signal once power is supplied.
Note 2: 6A003.b.4.a does not control imaging cameras incorporating linear “focal plane arrays” with twelve elements or fewer, not employing time-delay-and-integration within the element, designed for any of the following:
a. Industrial or civilian intrusion alarm, traffic or industrial movement control or counting systems;
b. Industrial equipment used for inspection or monitoring of heat flows in buildings, equipment or industrial processes;
c. Industrial equipment used for inspection, sorting or analysis of the properties of materials;
d. Equipment specially designed for laboratory use; or
e. Medical equipment.
Note 3: 6A003.b.4.b. does not control imaging cameras having any of the following characteristics:
a. A maximum frame rate equal to or less than 9 Hz;
b. Having all of the following:
1. Having a minimum horizontal or vertical Instantaneous-Field-of-View (IFOV) of at least 10 mrad/pixel (milliradians/pixel);
2. Incorporating a fixed focal-length lens that is not designed to be removed;
3. Not incorporating a direct view display, and
Technical Note: “Direct view” refers to an imaging camera operating in the infrared spectrum that presents a visual image to a human observer using a near-to-eye micro display incorporating any light-security mechanism.
4. Having any of the following:
a. No facility to obtain a viewable image of the detected field-of-view, or
b. The camera is designed for a single kind of application and designed not to be user modified, or
Technical Note: Instantaneous Field of View (IFOV) specified in Note 3.b is the lesser figure of the Horizontal FOV or the Vertical FOV.
Horizontal IFOV = horizontal Field of View (FOV)/number of horizontal detector elements
Vertical IFOV = vertical Field of View (FOV)/number of vertical detector elements
c. Where the camera is specially designed for installation into a civilian passenger land vehicle of less than three tons (gross vehicle weight) and having all of the following:
1. Is operable only when installed in any of the following:
a. The civilian passenger land vehicle for which it was intended; or
b. A specially designed, authorized maintenance test facility; and
2. Incorporates an active mechanism that forces the camera not to function when it is removed from the vehicle for which it was intended.
Note: When necessary, details of the items will be provided, upon request, to the Bureau of Industry and Security in order to ascertain compliance with the conditions described in Note 3.b.4. and Note 3.c. in this Note to 6A003.b.4.b.
6A004 Optics.
License Requirements
Reason for Control: NS, AT.
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Control(s) Country chart
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NS applies to entire entry............. NS Column 2.
AT applies to entire entry............. AT Column 1.
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License Requirement Notes: See §743.1 of the EAR for reporting requirements for exports under License Exceptions.
License Exceptions
LVS: $3000
GBS: Yes for 6A004.a.1, a.2, a.4, b, d.2, and d.4
CIV: Yes for 6A004.a.1, a.2, a.4, b, d.2, and d.4
List of Items Controlled
Unit: Equipment in number; cable in meters/feet; components in $ value.
Related Controls: “Space qualified” components for optical systems defined in 6A004.c and optical control equipment defined in 6A004.d.1 are subject to the export licensing authority of the Department of State, Directorate of Defense Trade Controls (22 CFR part 121). See also 6A994
Related Definitions: N/A.
Items:
a. Optical mirrors (reflectors), as follows:
a.1. “Deformable mirrors” having either continuous or multi-element surfaces, and specially designed components therefor, capable of dynamically repositioning portions of the surface of the mirror at rates exceeding 100 Hz;
a.2. Lightweight monolithic mirrors having an average “equivalent density” of less than 30 kg/m 2 and a total mass exceeding 10 kg;
a.3. Lightweight “composite” or foam mirror structures having an average “equivalent density” of less than 30 kg/m 2 and a total mass exceeding 2 kg;
a.4. Beam steering mirrors more than 100 mm in diameter or length of major axis, that maintain a flatness of lambda/2 or better (lambda is equal to 633 nm) having a control bandwidth exceeding 100 Hz.
b. Optical components made from zinc selenide (ZnSe) or zinc sulphide (ZnS) with transmission in the wavelength range exceeding 3,000 nm but not exceeding 25,000 nm and having any of the following:
b.1. Exceeding 100 cm3 in volume; or
b.2. Exceeding 80 mm in diameter or length of major axis and 20 mm in thickness (depth).
c. “Space-qualified” components for optical systems, as follows:
c.1. Lightweighted to less than 20% “equivalent density” compared with a solid blank of the same aperture and thickness;
c.2. Substrates, substrates having surface coatings (single-layer or multi-layer, metallic or dielectric, conducting, semiconducting or insulating) or having protective films;
c.3. Segments or assemblies of mirrors designed to be assembled in space into an optical system with a collecting aperture equivalent to or larger than a single optic 1 m in diameter;
c.4. Manufactured from “composite” materials having a coefficient of linear thermal expansion equal to or less than 5 × 10-6 in any coordinate direction.
d. Optical control equipment, as follows:
d.1. Specially designed to maintain the surface figure or orientation of the “space-qualified” components controlled by 6A004.c.1 or 6A004.c.3;
d.2. Having steering, tracking, stabilization or resonator alignment bandwidths equal to or more than 100 Hz and an accuracy of 10 µrad (microradians) or less;
d.3. Gimbals having all of the following:
d.3.a. A maximum slew exceeding 5°;
d.3.b. A bandwidth of 100 Hz or more;
d.3.c. Angular pointing errors of 200 µrad (microradians) or less; and
d.3.d. Having any of the following:
d.3.d.1. Exceeding 0.15 m but not exceeding 1 m in diameter or major axis length and capable of angular accelerations exceeding 2 rad (radians)/s 2 ; or
d.3.d.2. Exceeding 1 m in diameter or major axis length and capable of angular accelerations exceeding 0.5 rad (radians)/s 2 ;
d.4. Specially designed to maintain the alignment of phased array or phased segment mirror systems consisting of mirrors with a segment diameter or major axis length of 1 m or more.
e. Aspheric optical elements having all of the following characteristics:
e.1. The largest dimension of the optical-aperture is greater than 400 mm;
e.2. The surface roughness is less than 1 nm (rms) for sampling lengths equal to or greater than 1 mm; and
e.3. The coefficient of linear thermal expansion's absolute magnitude is less than 3 × 10-6/K at 25 °C;
Technical Notes: 1. An “aspheric optical element” is any element used in an optical system whose imaging surface or surfaces are designed to depart from the shape of an ideal sphere.
2. Manufacturers are not required to measure the surface roughness listed in 6A004.e.2 unless the optical element was designed or manufactured with the intent to meet, or exceed, the control parameter.
Note: 6A004.e does not control aspheric optical elements having any of the following:
a. A largest optical-aperture dimension less than 1 m and a focal length to aperture ratio equal to or greater than 4.5:1;
b. A largest optical-aperture dimension equal to or greater than 1 m and a focal length to aperture ratio equal to or greater than 7:1;
c. Being designed as Fresnel, flyeye, stripe, prism or diffractive optical elements;
d. Being fabricated from borosilicate glass having a coefficient of linear thermal expansion greater than 2.5 × 10-6/K at 25 °C; or
e. Being an x-ray optical element having inner mirror capabilities (e.g., tube-type mirrors).
N.B.: For aspheric optical elements specially designed for lithographic equipment, see 3B001.
6A005 “Lasers” (other than those described in 0B001.g.5 or .h.6), components and optical equipment, as follows (see List of Items Controlled).
License Requirements
Reason for Control: NS, NP, AT
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Control(s) Country chart
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NS applies to entire entry............. NS Column 2.
NP applies to ``lasers'' controlled by NP Column 1.
6A005.a.1.c, a.2.a, a.4.c., a.6,
c.1.b, c.2.b.2.a, c.2.b.2.b, c.2.c.2,
or d.2.c, as described in the
following License Requirements Note.
AT applies to entire entry............. AT Column 1.
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License Requirements Note: NP controls apply to the following “lasers” controlled by 6A005:
(a) Pulsed excimer “lasers” controlled by 6A005.a.1.c having all of the following characteristics:
(1) Operating at wavelengths between 240 and 360 nm;
(2) A repetition rate > 250 Hz; and
(3) An average output power > 500 W;
(b) Copper vapor “lasers” controlled by 6A005.a.2.a having all of the following characteristics:
(1) Operating at wavelengths between 500 and 600 nm; and
(2) An average output power = 40 W;
(c) Pulsed carbon dioxide “lasers” controlled by 6A005.a.4.c (except industrial CO2 lasers used in applications such as cutting and welding) having all of the following characteristics:
(1) Operating at wavelengths between 9,000 and 11,000 nm;
(2) A repetition rate > 250 Hz;
(3) An average output power > 500 W; and
(4) A pulse width < 200 ns;
(d) Argon ion “lasers” controlled by 6A005.a.6 having all of the following characteristics:
(1) Operating at wavelengths between 400 and 515 nm; and
(2) An average output power > 40 W;
(e) Alexandrite “lasers” controlled by 6A005.c.1.b having all of the following characteristics:
(1) Operating at wavelengths between 720 and 800 nm;
(2) A bandwidth = 0.005 nm;
(3) A repetition rate > 125 Hz; and
(4) Average output power > 30 W;
(f) Single-transverse mode output neodymium-doped (other than glass) “lasers” controlled by 6A005.c.2.b.2.a with an average output power > 40 W;
(g) Multiple-transverse mode output neodymium-doped (other than glass) “lasers” controlled by 6A005.c.2.b.2.b with an average output power > 50 W;
(h) Neodymium-doped (other than glass) “lasers” controlled by 6A005.c.2.c.2 having all of the following characteristics:
(1) Incorporating frequency doubling for output wavelength between 500 and 550 nm; and
(2) Average output power > 40 W;
(i) Tunable pulsed single-mode dye “lasers” controlled by 6A005.d.2.c operating at wavelengths between 300 and 800 nm.
License Exceptions
LVS: N/A for NP items. $3000 for all other items.
GBS: Yes, for 6A005.d (except d.2.c), CO2 or CO/CO2 “lasers” having an output wavelength in the range from 9,000 to 11,000 nm and having a pulsed output not exceeding 2 J per pulse and a maximum rated average single or multimode output power not exceeding 5 kW; CO “lasers” having a CW maximum rated single or multimode output power not exceeding 10 kW; CO2 “lasers” controlled by 6A005.a.4 that operate in CW multiple-transverse mode; and having a CW output power not exceeding 15 kW; Neodymium-doped (other than glass), pulse-excited, “Q-switched lasers” controlled by 6A005.c.2.b.2.b having a pulse duration equal to or more than 1 ns; and a multiple-transverse mode output with a “peak power” not exceeding 400 MW; Neodymium-doped (other than glass) “lasers” controlled by 6A005.c.2.b.3.b or 6A005.c.2.b.4.b that have an output wavelength exceeding 1,000 nm, but not exceeding 1,100 nm; and an average or CW output power not exceeding 2 kW; and operate in a pulse-excited, non-“Q-switched” multiple-transverse mode; or in a continuously excited, multiple-transverse mode; and 6A005.f.1.
CIV: Yes, for 6A005.d (except d.2.c), CO2 or CO/CO2 “lasers” having an output wavelength in the range from 9,000 to 11,000 nm and having a pulsed output not exceeding 2 J per pulse and a maximum rated average single or multimode output power not exceeding 5 kW; CO “lasers” having a CW maximum rated single or multimode output power not exceeding 10 kW; CO2 “lasers” controlled by 6A005.a.4 that operate in CW multiple-transverse mode; and having a CW output power not exceeding 15 kW; Neodymium-doped (other than glass), pulse-excited, “Q-switched lasers” controlled by 6A005.c.2.b.2.b having a pulse duration equal to or more than 1 ns; and a multiple-transverse mode output with a “peak power” not exceeding 400 MW; Neodymium-doped (other than glass) “lasers” controlled by 6A005.c.2.b.3.b or 6A005.c.2.b.4.b that have an output wavelength exceeding 1,000 nm, but not exceeding 1,100 nm; and an average or CW output power not exceeding 2 kW; and operate in a pulse-excited, non-“Q-switched” multiple-transverse mode; or in a continuously excited, multiple-transverse mode; and 6A005.f.1.
List of Items Controlled
Unit: Equipment in number; components and accessories in $ value.
Related Controls: (1) See ECCN 6D001 for “software” for items controlled under this entry. (2) See ECCNs 6E001 (“development”), 6E002 (“production”), and 6E201 (“use”) for technology for items controlled under this entry. (3) Also see ECCNs 6A205 and 6A995. (4) See ECCN 3B001 for excimer “lasers” specially designed for lithography equipment. (5) “Lasers” specially designed or prepared for use in isotope separation are subject to the export licensing authority of the Nuclear Regulatory Commission (see 10 CFR part 110). (6) Shared aperture optical elements, capable of operating in “super-high power laser” applications, are subject to the export licensing authority of the U.S. Department of State, Directorate of Defense Trade Controls (see 22 CFR part 121).
Related Definitions: (1.) Pulsed “lasers” include those that run in a continuous wave (CW) mode with pulses superimposed. (2.) Pulse-excited “lasers” include those that run in a continuously excited mode with pulse excitation superimposed. (3.) The control status of Raman “lasers” is determined by the parameters of the pumping source “lasers”. The pumping source “lasers” can be any of the “lasers” described as follows:
Items:
a. Gas “lasers”, as follows:
a.1. Excimer “lasers”, having any of the following:
a.1.a. An output wavelength not exceeding 150 nm and having any of the following: a.1.a.1. An output energy exceeding 50 mJ per pulse; or
a.1.a.2. An average output power exceeding 1 W;
a.1.b. An output wavelength exceeding 150 nm but not exceeding 190 nm and having any of the following:
a.1.b.1. An output energy exceeding 1.5 J per pulse; or
a.1.b.2. An average output power exceeding 120 W;
a.1.c. An output wavelength exceeding 190 nm but not exceeding 360 nm and having any of the following:
a.1.c.1. An output energy exceeding 10 J per pulse; or
a.1.c.2. An average output power exceeding 500 W; or
a.1.d. An output wavelength exceeding 360 nm and having any of the following:
a.1.d.1. An output energy exceeding 1.5 J per pulse; or
a.1.d.2. An average output power exceeding 30 W;
N.B.: For excimer “lasers” specially designed for lithography equipment, see 3B001.
a.2. Metal vapor “lasers”, as follows:
a.2.a. Copper (Cu) “lasers” having an average output power exceeding 20 W;
a.2.b. Gold (Au) “lasers” having an average output power exceeding 5 W;
a.2.c. Sodium (Na) “lasers” having an output power exceeding 5 W;
a.2.d. Barium (Ba) “lasers” having an average output power exceeding 2 W;
a.3. Carbon monoxide (CO) “lasers” having any of the following:
a.3.a. An output energy exceeding 2 J per pulse and a pulsed “peak power” exceeding 5 kW; or
a.3.b. An average or CW output power exceeding 5 kW;
a.4. Carbon dioxide (CO2) “lasers” having any of the following:
a.4.a. A CW output power exceeding 15 kW;
a.4.b. A pulsed output having a “pulse duration” exceeding 10 µs and having any of the following:
a.4.b.1. An average output power exceeding 10 kW; or
a.4.b.2. A pulsed “peak power” exceeding 100 kW; or
a.4.c. A pulsed output having a “pulse duration” equal to or less than 10 µs; and having any of the following:
a.4.c.1. A pulse energy exceeding 5 J per pulse; or
a.4.c.2. An average output power exceeding 2.5 kW;
a.5. “Chemical lasers”, as follows:
a.5.a. Hydrogen Fluoride (HF) “lasers”;
a.5.b. Deuterium Fluoride (DF) “lasers”;
a.5.c. “Transfer lasers”, as follows:
a.5.c.1. Oxygen Iodine (O2-I) “lasers”;
a.5.c.2. Deuterium Fluoride-Carbon dioxide (DF-CO2) “lasers”;
a.6. Krypton ion or argon ion “lasers” having any of the following:
a.6.a. An output energy exceeding 1.5 J per pulse and a pulsed “peak power” exceeding 50 W; or
a.6.b. An average or CW output power exceeding 50 W;
a.7. Other gas “lasers”, having any of the following:
Note: 6A005.a.7 does not control nitrogen “lasers”.
a.7.a. An output wavelength not exceeding 150 nm and having any of the following:
a.7.a.1. An output energy exceeding 50 mJ per pulse and a pulsed “peak power” exceeding 1 W; or
a.7.a.2. An average or CW output power exceeding 1 W;
a.7.b. An output wavelength exceeding 150 nm but not exceeding 800 nm and having any of the following:
a.7.b.1. An output energy exceeding 1.5 J per pulse and a pulsed “peak power” exceeding 30 W; or
a.7.b.2. An average or CW output power exceeding 30 W;
a.7.c. An output wavelength exceeding 800 nm but not exceeding 1,400 nm and having any of the following:
a.7.c.1. An output energy exceeding 0.25 J per pulse and a pulsed “peak power” exceeding 10 W; or
a.7.c.2. An average or CW output power exceeding 10 W; or
a.7.d. An output wavelength exceeding 1,400 nm and an average or CW output power exceeding 1 W.
b. Semiconductor “lasers”, as follows:
Note 1: 6A005.b. includes semiconductor “lasers” having optical output connectors (e.g., fiber optic pigtails).
Note 2: The control status of semiconductor “lasers” specially designed for other equipment is determined by the control status of the other equipment.
b.1. Individual single-transverse mode semiconductor “lasers” having any of the following:
b.1.a. A wavelength equal to or less than 1510 nm, and having an average or CW output power exceeding 1.5 W; or
b.1.b. A wavelength greater than 1510 nm, and having an average or CW output power exceeding 500 mW;
b.2. Individual, multiple-transverse mode semiconductor “lasers” , having any of the following:
b.2.a. A wavelength of less than 1400 nm, and having an average or CW output power exceeding 10W;
b.2.b. A wavelength equal to or greater than 1400 nm and less than 1900 nm, and having an average or CW output power exceeding 2.5 W; or
b.2.c. A wavelength equal to or greater than 1900 nm and having an average or CW output power exceeding 1 W.
b.3. Individual semiconductor “laser” arrays, having any of the following:
b.3.a. A wavelength of less than 1400 nm and having an average or CW output power exceeding 80 W; or
b.3.b. A wavelength equal to or greater than 1400 nm and less than 1900 nm, and having an average or CW output power exceeding 25 W; or
b.3.c. A wavelength equal to or greater than 1900 nm, and having an average or CW output power exceeding 10 W.
b.4. Array stacks of semiconductor “lasers” containing at least one array that is controlled under 6A005.b.3.
Technical Notes: 1. Semiconductor “lasers” are commonly called “laser” diodes.
2. An “array” consists of multiple semiconductor “laser” emitters fabricated as a single chip so that the centers of the emitted light beams are on parallel paths.
3. An “array stack” is fabricated by stacking, or otherwise assembling, “arrays” so that the centers of the emitted light beams are on parallel paths.
c. Solid state “lasers”, as follows:
c.1. “Tunable” “lasers” having any of the following:
Note: 6A005.c.1 includes titanium-sapphire (Ti: Al2O3), thulium-YAG (Tm: YAG), thulium-YSGG (Tm: YSGG), alexandrite (Cr: BeAl2O4) and color center “lasers”.
c.1.a. An output wavelength less than 600 nm and having any of the following:
c.1.a.1. An output energy exceeding 50 mJ per pulse and a pulsed “peak power” exceeding 1 W; or
c.1.a.2. An average or CW output power exceeding 1 W;
c.1.b. An output wavelength of 600 nm or more but not exceeding 1,400 nm and having any of the following:
c.1.b.1. An output energy exceeding 1 J per pulse and a pulsed “peak power” exceeding 20 W; or
c.1.b.2. An average or CW output power exceeding 20 W; or
c.1.c. An output wavelength exceeding 1,400 nm and having any of the following:
c.1.c.1. An output energy exceeding 50 mJ per pulse and a pulsed “peak power” exceeding 1 W; or
c.1.c.2. An average or CW output power exceeding 1 W;
c.2. Non-“tunable” “lasers”, as follows:
Note: 6A005.c.2 includes atomic transition solid state “lasers”.
c.2.a. Neodymium glass “lasers”, as follows:
c.2.a.1. “Q-switched lasers” having any of the following:
c.2.a.1.a. An output energy exceeding 20 J but not exceeding 50 J per pulse and an average output power exceeding 10 W; or
c.2.a.1.b. An output energy exceeding 50 J per pulse;
c.2.a.2. Non-“Q-switched lasers” having any of the following:
c.2.a.2.a. An output energy exceeding 50 J but not exceeding 100 J per pulse and an average output power exceeding 20 W; or
c.2.a.2.b. An output energy exceeding 100 J per pulse;
c.2.b. Neodymium-doped (other than glass) “lasers”, having an output wavelength exceeding 1,000 nm but not exceeding 1,100 nm, as follows:
N.B.: For neodymium-doped (other than glass) “lasers” having an output wavelength not exceeding 1,000 nm or exceeding 1,100 nm, see 6A005.c.2.c.
c.2.b.1. Pulse-excited, mode-locked, “Q-switched lasers” having a “pulse duration” of less than 1 ns and having any of the following:
c.2.b.1.a. A “peak power” exceeding 5 GW;
c.2.b.1.b. An average output power exceeding 10 W; or
c.2.b.1.c. A pulsed energy exceeding 0.1 J;
c.2.b.2. Pulse-excited, “Q-switched lasers” having a pulse duration equal to or more than 1 ns, and having any of the following:
c.2.b.2.a. A single-transverse mode output having:
c.2.b.2.a.1. A “peak power” exceeding 100 MW;
c.2.b.2.a.2. An average output power exceeding 20 W; or
c.2.b.2.a.3. A pulsed energy exceeding 2 J; or
c.2.b.2.b. A multiple-transverse mode output having:
c.2.b.2.b.1. A “peak power” exceeding 400 MW;
c.2.b.2.b.2. An average output power exceeding 2 kW; or
c.2.b.2.b.3. A pulsed energy exceeding 2 J;
c.2.b.3. Pulse-excited, non-“Q-switched lasers”, having:
c.2.b.3.a. A single-transverse mode output having:
c.2.b.3.a.1. A “peak power” exceeding 500 kW; or
c.2.b.3.a.2. An average output power exceeding 150 W; or
c.2.b.3.b. A multiple-transverse mode output having:
c.2.b.3.b.1. A “peak power” exceeding 1 MW; or
c.2.b.3.b.2. An average power exceeding 2 kW;
c.2.b.4. Continuously excited “lasers” having:
c.2.b.4.a. A single-transverse mode output having:
c.2.b.4.a.1. A “peak power” exceeding 500 kW; or
c.2.b.4.a.2. An average or CW output power exceeding 150 W; or
c.2.b.4.b. A multiple-transverse mode output having:
c.2.b.4.b.1. A “peak power” exceeding 1 MW; or
c.2.b.4.b.2. An average or CW output power exceeding 2 kW;
c.2.c. Other non-“tunable” “lasers”, having any of the following:
c.2.c.1. A wavelength less than 150 nm and having any of the following:
c.2.c.1.a. An output energy exceeding 50 mJ per pulse and a pulsed “peak power” exceeding 1 W; or
c.2.c.1.b. An average or CW output power exceeding 1 W;
c.2.c.2. A wavelength of 150 nm or more but not exceeding 800 nm and having any of the following:
c.2.c.2.a. An output energy exceeding 1.5 J per pulse and a pulsed “peak power” exceeding 30 W; or
c.2.c.2.b. An average or CW output power exceeding 30 W;
c.2.c.3. A wavelength exceeding 800 nm but not exceeding 1,400 nm, as follows:
c.2.c.3.a. “Q-switched lasers” having:
c.2.c.3.a.1. An output energy exceeding 0.5 J per pulse and a pulsed “peak power” exceeding 50 W; or
c.2.c.3.a.2. An average output power exceeding:
c.2.c.3.a.2.a. 10 W for single-mode “lasers”;
c.2.c.3.a.2.b. 30 W for multimode “lasers”;
c.2.c.3.b. Non-“Q-switched lasers” having:
c.2.c.3.b.1. An output energy exceeding 2 J per pulse and a pulsed “peak power” exceeding 50 W; or
c.2.c.3.b.2. An average or CW output power exceeding 50 W; or
c.2.c.4. A wavelength exceeding 1,400 nm and having any of the following:
c.2.c.4.a. An output energy exceeding 100 mJ per pulse and a pulsed “peak power” exceeding 1 W; or
c.2.c.4.b. An average or CW output power exceeding 1 W;
d. Dye and other liquid “lasers”, having any of the following:
d.1. A wavelength less than 150 nm and;
d.1.a. An output energy exceeding 50 mJ per pulse and a pulsed “peak power” exceeding 1 W; or
d.1.b. An average or CW output power exceeding 1 W;
d.2. A wavelength of 150 nm or more but not exceeding 800 nm and having any of the following:
d.2.a. An output energy exceeding 1.5 J per pulse and a pulsed “peak power” exceeding 20 W;
d.2.b. An average or CW output power exceeding 20 W; or
d.2.c. A pulsed single longitudinal mode oscillator having an average output power exceeding 1 W and a repetition rate exceeding 1 kHz if the “pulse duration” is less than 100 ns;
d.3. A wavelength exceeding 800 nm but not exceeding 1,400 nm and having any of the following:
d.3.a. An output energy exceeding 0.5 J per pulse and a pulsed “peak power” exceeding 10 W; or
d.3.b. An average or CW output power exceeding 10 W; or
d.4. A wavelength exceeding 1,400 nm and having any of the following:
d.4.a. An output energy exceeding 100 mJ per pulse and a pulsed “peak power” exceeding 1 W; or
d.4.b. An average or CW output power exceeding 1 W;
e. Components, as follows:
e.1. Mirrors cooled either by active cooling or by heat pipe cooling;
Technical Note: Active cooling is a cooling technique for optical components using flowing fluids within the subsurface (nominally less than 1 mm below the optical surface) of the optical component to remove heat from the optic.
e.2. Optical mirrors or transmissive or partially transmissive optical or electro-optical components specially designed for use with controlled “lasers”;
f. Optical equipment, as follows:
N.B.: For shared aperture optical elements, capable of operating in “Super-High Power Laser” (“SHPL”) applications, see the U.S. Munitions List (22 CFR part 121).
f.1. Dynamic wavefront (phase) measuring equipment capable of mapping at least 50 positions on a beam wavefront having any of the following:
f.1.a. Frame rates equal to or more than 100 Hz and phase discrimination of at least 5% of the beam's wavelength; or
f.1.b. Frame rates equal to or more than 1,000 Hz and phase discrimination of at least 20% of the beam's wavelength;
f.2. “Laser” diagnostic equipment capable of measuring “SHPL” system angular beam steering errors of equal to or less than 10 µrad;
f.3. Optical equipment and components specially designed for a phased-array “SHPL” system for coherent beam combination to an accuracy of lambda/10 at the designed wavelength, or 0.1 µm, whichever is the smaller;
f.4. Projection telescopes specially designed for use with “SHPL” systems.
6A006 “Magnetometers”, “magnetic gradiometers”, “intrinsic magnetic gradiometers” and compensation systems, and specially designed components therefor, as follows (see List of Items Controlled).
License Requirements
Reason for Control: NS, AT
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Control(s) Country chart
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NS applies to entire entry............. NS Column 2
AT applies to entire entry............. AT Column 1
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License Requirement Notes: See §743.1 of the EAR for reporting requirements for exports under License Exceptions.
License Exceptions
LVS: $1500, N/A for 6A006.a.1; “Magnetometers” and subsystems defined in 6A006.a.2 using optically pumped or nuclear precession (proton/Overhauser) having a “noise level” (sensitivity) lower (better) than 2 pT rms per square root Hz; and 6A006.c.
GBS: N/A
CIV: N/A
List of Items Controlled
Unit: $ value
Related Controls: See also 6A996. This entry does not control instruments specially designed for biomagnetic measurements for medical diagnostics.
Related Definitions: N/A
Items:
a. “Magnetometers” and subsystems, as follows:
a.1.Using “superconductive” (SQUID) “technology” and having any of the following characteristics: (continued)